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001｜F. K. Wang, A hybrid approach to estimate the parameters of the diffusion model, 24th International symposium on forecasting, July 4-7, 2004.
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002｜F. K. Wang, A case study of VMI using TOC, ICEB2003, December 9-13, 2003.
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003｜J. T. Lin, F. K. Wang, and P. C. Kuo, Parameterized dispatching rule for a Logic IC sort in wafer fab, APIEM2002, December 18-20, 2002.
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004｜J. T. Lin, F. K. Wang, and C. K. Wu, The Connecting transport of automated material handling system in wafer fab, Annual Meeting of the Industrial Engineering and Enterprise Management (IE&EM), September 19-21, 2002.
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005｜F. K. Wang, T. Du and E. Lee, Applying six-sigma to supplier development, Proceedings of the Seventh Annual Meeting of the Asia Pacific Decision Sciences Institute, July 24-27, 2002.
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006｜F. K. Wang, W. Lee, Y. W. Chen and Y. M. Chang, The review of TPM and DEA in TPM, Proceedings of the Second Annual Meeting of the Chinese TPM, May 24, 2001, pp. D2-117. (in Chinese).
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007｜F. K. Wang, Confidence Intervals in Repeatability & Reproducibility Studies Using Bootstrap Method, Proceedings of the Thirtieth Annual Meeting of the Western Decision Sciences Institute, April 3-7, 2001.
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008｜James T. Lin, Fu-Kwun Wang, and Ping-Yung Yen, Simulation Analysis of 300mm Intrabay Automation for a Wafer Fab, The 5th Annual International Conference on Industrial Engineering - Theory, Applications and Practice, December 13-15, 2000.
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009｜F. K. Wang and W. Lee, The learning curves analysis in TPM, Proceedings of the First Annual Meeting of the Chinese TPM, May 19, 2000, pp. 305-319. (in Chinese).
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010｜F. K. Wang, ' A New Model with Bathtub-Shaped Failure Rate Using an Additive Burr XII Distribution', Proceedings of the Twenty-Ninth Annual Meeting of the Western Decision Sciences Institute, April 18-22, 2000. (Best Paper Award).
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011｜Fu-Kwun Wang and Sheng-Pen Wang, 'Confidence Interval for the Mean of a Non-Normal Data, 5th International conference of the Decision Sciences Institute, July 4-7, 1999.
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012｜F. K. Wang, ‘Comparison of Different Methods in Repeatability & Reproducibility Study’, Proceedings of the Twenty-Eighth Annual Meeting of the Western Decision Sciences Institute, April 6-10, 1999, pp. 767-769.
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013｜F. K. Wang, The reliability life analysis of microelectronic devices, Chinese IIE Annual Conference, pp. 516-520, 1998. (in Chinese).
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014｜F. K. Wang and T. S. Lee, ‘The Repeatability & Reproducibility on Statistical Process Control’, Chinese IIE Annual Conference, pp. 394-399, 1997.
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015｜C. Y. Chen and F. K. Wang, ‘Recognizing Manufacturing Cells and Duplication Machines Using Statistical Approaches: OVERCLUS and PCA’, Chinese IIE Annual Conference, pp. 746-754, 1996.
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016｜F. K. Wang and C. Y. Chen, ‘Geometry of Tolerance Zone for Form and Location’, Chinese IIE Annual Conference, pp. 755-762, 1996.
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017｜F. K. Wang, Norma F. Hubele, Frederick Lawrence, and J. Miskulin, ‘Multivariate Process Capability Indices: Graphical and Statistical Comparisons’, 1996 Fall Technical Conference of ASQC, October 23-25, 1996.
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018｜F. K. Wang, Norma F. Hubele, Frederick Lawrence, J. Miskulin and Shahriari H., ‘Comparison of Three Multivariate Process Capability Indices’, 5th Industrial Engineering Research Conference, May18-20, 1996.
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019｜J. Bert Keats and F. K. Wang, ‘Optimal Percentile Estimators for the Two-Parameter Weibull Distribution’, 17th International Conference on Computers and Industrial Engineering, Phoenix, March 5-8, 1995.
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